Many have dreamed of detecting particles above wafer during processing. That dream is now a reality.
The HYT 9020 Series can help you find process particles before wafer yield is affected through real-time monitoring of process particles.
![](javascript:imagezoom(515,234,"/var/hachultra/storage/images/media/images/hyt/hyt_9020_for_web/14950-1-eng-GB/hyt_9020_for_web_zoom.jpg");)
